8-K

                   UNITED STATES SECURITIES AND EXCHANGE COMMISSION
                              Washington, D.C. 20549

________________________________________________________________________________


                                    FORM 8-K

                                  CURRENT REPORT

        PURSUANT TO SECTION 13 OR 15(d) OF THE SECURITITES EXCHANGE ACT OF 1934




October 30, 1996
Date of Report (Date of earliest event reported)
________________________________________________________________________________



                        INTEGRATED MEASUREMENT SYSTEMS, INC.
                (Exact name of registrant as specified in its charter)


OREGON                                                 93-0840631
(State or other jurisdiction of                        (I.R.S. Employer 
incorporation or organization)                         Identification No.)

                         Commission File No. 0-26274

9525 S.W. GEMINI DRIVE, BEAVERTON OR                   97008
(Address of principal executive officers)              (zip code)

REGISTRANT'S TELEPHONE NUMBER, INCLUDING AREA CODE:    (503) 626-7117

________________________________________________________________________________





ITEM 5.  OTHER EVENTS

     Press Releases
     
     IMS Announces Data Communications Mixed-Signal Test Station
          On October 30, 1996, Integrated Measurement Systems, Inc. announced a
          new mixed-signal Test Station configured for data communications
          applications.  Full text is attached to this report as Exhibit 99a.
     
     IMS ATS 60e Sets New Performance/Price Standard
          On October 31, 1996, Integrated Measurement Systems, Inc. announced a
          60e data module for their ATS Blazer-TM- and MTS Blazer-TM- Test
          Stations providing a low-cost entry point for testing complex devices
          such as deep submicron ASICs, microprocessors, mixed-signal devices
          and MCMs.  Full text is attached to this report as Exhibit 99b.
     
     IMS Announces Significant Enhancements in Virtual Test Environment
          On November 4, 1996, Integrated Measurement Systems, Inc. announced
          several enhancements to their Dantes-TM- test design and verification
          environment that helps test engineers improve test productivity and
          reduce time-to-market.  Full text is attached to this report as
          Exhibit 99c.


ITEM 6.   EXHIBITS

     (exhibit reference numbers refer to Item 601 of Regulation S-K)
     
     99a. Press Release -- IMS Announces Data Communications Mixed-Signal Test
          Station
     
     99b. Press Release -- IMS ATS 60e Sets New Performance/Price Standard
     
     99c. Press Release -- IMS Announces Significant Enhancements in Virtual
          Test Environment





                                SIGNATURES
Pursuant to the requirements of the Securities Exchange Act of 1934, the
Registrant has duly caused this report to be signed on its behalf by the
undersigned thereunto duly authorized on November 11, 1996.

                    INTEGRATED MEASUREMENT SYSTEMS, INC.    
                    (Registrant)

                    /s/   Sar Ramadan
                    ------------------------------
                    Sar Ramadan
                    Chief Financial Officer

EX-99.A

                                                                     EXHIBIT 99a

                                                                   PRESS RELEASE

BEAVERTON, Ore.--(BUSINESS WIRE)--Oct. 30, 1996-- 

              IMS ANNOUNCES DATA COMMUNICATIONS MIXED-SIGNAL TEST STATION

           NEW APPLICATION-SPECIFIC TEST STATION TARGETED AT ENGINEERING DEBUG,
           CHARACTERIZATION AND TEST OF HIGH-SPEED DATA COMMUNICATIONS DEVICES 

Integrated Measurement Systems Inc. (IMSC) today announced a new mixed-signal
Test Station configured for data communications applications. 

The MTS-TM- Datacom-configured Test Station optimized for analyzing and
characterizing high-speed components used in data communications applications --
DACs, ADCs, DSPs, phased lock loops, and ISDN, SONET, ATM and Ethernet devices,
was demonstrated last week at ITC '96 in Washington, D.C., testing 10base-T and
100base-T circuits. 

The Test Station consists of a full complement of high performance digital pin
electronics, and includes integral arbitrary waveform generation, waveform
digitization and time measurement subsystems that connect to the device under
test via a built-in RF multiplexer. This tightly integrated mixed-signal system
provides test engineers with the lowest cost-of-ownership and the shortest time-
to-market solution to their design validation tasks for datacom devices. 

"At SEMICON in July, we announced our multimedia configured mixed-signal Test
Station. This data communication configured system is the next step in our
strategy to build a family of application-specific Test Stations that provide
solutions with the maximized performance, while continuing to lower the cost of
test," said Jon Turino, marketing manager for Mixed-Signal Test Stations at IMS.

Unparalleled Test Performance 

The MTS Test Stations can be configured for up to 200 MHz digital data rates,
with up to 448 digital I/O pins. The Test Station provides 1.4 GHz bandwidth
analog signal distribution, with 64 analog channels for testing DC through RF
mixed-signal devices. 

With the MTS Test Stations, users can choose a wide range of speed and memory
depths, ensuring the optimum performance for their specific applications. This
performance is coupled with a low-noise floor analog environment for maximum
signal isolation. The incorporated Digital Signal Processing (DSP) library
allows users to make the full complement of converter measurements, including
signal-to-noise, distortion and linearity. 

The Flex-Time-TM- capability in the MTS FT Test Stations provides the critical
path timing analysis necessary for fully validating leading edge datacom
devices.  Through a technique called cycle stretch and shrink, users can adjust
the cycle and edge timing on devices on the fly. The new Time Navigator II-TM-
window permits easy setup, modification, and analysis of test parameters,
reducing test time by as much as 50 percent over traditional test solutions.
This unique screen interface enables the MTS FT to considerably reduce the time
it takes to understand critical timing issues and perform timing
characterization. 

In the MTS Test Station, all mixed-signal resources are integrated into the same
programming toolset for a flexible and easy-to-use interface. IMS Test
Environment and TestVIEW combine pattern translation and development; program
development and debug; and interactive device verification for improved
engineering productivity. 

Price and Availability. The data communications mixed-signal MTS Test Station is
priced under $600,000 (US) for a typically configured system and is orderable
now, with delivery 16 weeks ARO.




Integrated Measurement Systems Inc. (IMSC), is the worldwide leader in
Engineering Test Stations and Virtual Test Software, providing cost-effective
solutions to reduce the time required to test and verify complex electronic
circuits. For the past four years, IMS has rated in the 10 BEST supplier of Test
and Material Handling Equipment in the VLSI Research Customer Survey. 

IMS is listed on the Nasdaq National Market under the symbol IMSC. For more
information, contact IMS at 9525 S.W. Gemini Drive, Beaverton, Oregon 97008.
Telephone 503/626-7117 or 800/879-7117. Or visit our Web Site: www.ims.com

EX-99.B

                                                                     EXHIBIT 99b

                                                                   PRESS RELEASE

WASHINGTON--(BUSINESS WIRE)--Oct. 31, 1996-- 

                    IMS ATS 60e SETS NEW PERFORMANCE/PRICE STANDARD

                NEW DATA MODULE FOR TEST STATIONS OFFERS UNMATCHED
                          PERFORMANCE FOR UNDER $2,000/PIN 

Integrated Measurement Systems Inc. (IMSC) today announced a new 60e data module
for their ATS Blazer-TM- and MTS Blazer-TM- Test Stations providing a low-cost
entry point for testing complex devices such as deep submicron ASICs,
microprocessors, mixed-signal devices and MCMs. 

Beginning at under $2,000 per channel, the ATS 60e data module has 16 I/O data
channels for parallel, at speed test at up to a 60 MHz rate. This new module can
be used in conjunction with other Test Station data modules rated at different
speeds and serial scan modules. 

"As the trend toward higher complexity and more customization continues, the
need for exclusive engineering use of a capable test system becomes more and
more critical," said Richard Gaunt, marketing manager for Digital Test Stations
at IMS. "Driving down the entry point for our ATS Blazer Test Stations allows
more engineers access to tools that will speed up the overall design cycle. At
one-third to one-half the cost of ATE testers, an IMS Test Station is a very
attractive alternative. The ATS 60e is another example of our commitment to
provide test solutions that continually help drive down the cost of test." 

Versatile Performance at a Lower Cost 

The ATS 60e Data Module provides 60 MHz I/O performance with 16 channels. The
ATS or MTS Blazer mainframes can be utilized with the 60e Data Module in
configurations that provide up to 448 digital I/O. The ATS 60e Data Module has
128K or 512K of local vector memory, with up to 8 M of optional dynamic vector
memory per pin. 

A special Low Leakage Mode of operation can be invoked, which reduces receiver
leakage to less than 250 nA. This is important when testing low-current 
semiconductors, such as implantable medical devices or other battery-operated
equipment.

Other key features include: seven bits of data behind every pin, allowing
Realtime Compare and Acquire for instant error detection and reporting; per pin
programmable functions such as driver levels, dual comparator levels, active
loads, force and compare timing, tristate and masking, and data formats. The 60e
can be ordered with an optional DC PMU per pin. Economical bipolar technology is
used in the critical driver and comparator circuitry, reducing cost compared to
other technologies, without sacrificing performance. 

Comprehensive Test Station Functionality 

The ATS Test Station series include the MTS mixed-signal Test Station for
seamless testing of critical analog characteristics. Both the ATS and MTS Test
Stations digital capabilities include full per-pin programmability and can be
used with scan modules providing up to 32M of serial memory per channel. The ATS
Test Stations are supported in a wide variety of EDA simulation environments and
are configurable in 16-pin increments up to 448 pins. Time Domain Reflectometry
(TDR) simplifies the design and use of high-performance fixtures. 

Price and Availability: A fully configured 192-pin ATS Test Station is priced at
under $400,000. The ATS 60e Data Module is available now, with delivery 8 weeks
ARO.
 


Integrated Measurement Systems Inc. (IMSC), is the worldwide leader in
Engineering Test Stations and Virtual Test Software, providing cost-effective
solutions to reduce the time required to test and verify complex electronic
circuits. For the past three years, IMS has rated in the 10 BEST Supplier of
Test and Material Handling Equipment in the VLSI Research Customer Survey. IMS
is listed on the Nasdaq National Market under the symbol IMSC. For more
information, contact IMS at 9525 S.W. Gemini Drive, Beaverton, Oregon 97008.
Telephone: 503/626-7117 or 800/879-7117 or visit our Web site at www.ims.com.

EX-99.C

                                                                     EXHIBIT 99c

                                                                   PRESS RELEASE

BEAVERTON, Ore.--(BUSINESS WIRE)--Nov. 4, 1996-- 

           IMS ANNOUNCES SIGNIFICANT ENHANCEMENTS IN VIRTUAL TEST ENVIRONMENT

         DANTES 2.0 MEETS CUSTOMER REQUIREMENTS FOR MULTIPLE TEST METHODOLOGIES 

Integrated Measurement Systems, Inc. (IMSC) today announced several enhancements
to their Dantes-TM- test design and verification environment that helps test
engineers improve test productivity and reduce time-to-market. 

Dantes 2.0 enhancements include interactive simulation support, improved forms
technology, and a new use methodology that allows the user to start with a
complete test schematic (FTS-Final Test Schematic). 

"These enhancements in the Dantes environment will greatly enhance the
productivity of existing Dantes users," stated Steve Morris, Director of
Marketing for the Virtual Test Division at IMS. "Customer feedback on what
additional capabilities they wanted in Dantes and responded with an enhanced
tool set that meets their test requirements." 

Proven Performance 

Dantes test design and verification environment supports graphical test capture,
modeling, rule-checking, simulation, ATE-specific code generation, fixture
design, verification and documents for mixed-signal tests. 

It enables test engineers to extend the design database into a true test
database, providing a common set of tools throughout the entire test development
process.  Dantes leverages a broad range of Cadence Design Systems EDA
technologies allowing the test engineer to design and verify tests on a
workstation before first silicon. 

Expanded functionality 

- -- Interactive simulation allows the user to stop the simulation, change
instrument setups, and restart the test at any point in the test cycle. The user
can observe instrument parameters such as the voltage levels and waveforms, and
examine and modify setups at any time during the simulation. 

- -- Improved forms technology. Dantes 2.0 property forms are now more flexible
and easier to use. Multiple forms can be opened at the same time and a new
layout makes accessing the forms more convenient and usable. 

- -- Final Test Schematic. Previously, Dantes users had to enter one or more Test
Module Schematics (TMS), one for each test, before generating the FTS. With
Dantes 2.0, the user can begin by entering the entire FTS -- the combination of
all connections required for each TMS into one "final" test schematic, and then
create TMS' by selecting a subset of the FTS. This speeds the process of
entering test information by 50 percent or more. 

Additionally, Dantes 2.0 provides increased flexibility in formatting
documentation generation layout for better customization and better
documentation readability. 

Price and Availability: Dantes 2.0 is priced at $80,000 to $100,000 depending on
licensing arrangement, and is available in December 1996. 

Integrated Measurement Systems Inc. (IMSC), is the worldwide leader in
Engineering Test Stations and Virtual Test Software, providing cost-effective
solutions to reduce the time required to test and verify complex electronic
circuits. For the past three years, IMS has rated in the 10 BEST Supplier of
Test and Material Handling Equipment in the VLSI Research Customer Survey. 



IMS is listed on the Nasdaq National Market under the symbol IMSC. For more
information, contact IMS at 9525 S.W. Gemini Drive, Beaverton, Oregon 97008.
Telephone 503/626-7117 or 800/879-7117, or visit our Web Site: www.ims.com