8-K

                                 UNITED STATES
                       SECURITIES AND EXCHANGE COMMISSION
                            Washington, D.C. 20549

                                    FORM 8-K

                                CURRENT REPORT
                      PURSUANT TO SECTION 13 OR 15(d) OF
                     THE SECURITIES EXCHANGE ACT OF 1934

        Date of Report (date of earliest event reported): July 9, 2007

                                Aehr Test Systems
             (Exact name of Registrant as specified in its charter)

          California                    000-22893             94-2424084
(State or other jurisdiction of  [Commission File Number]  (I.R.S. Employer
 incorporation or organization)                         Identification Number)

                               400 Kato Terrace
                           Fremont, California 94539
         (Address of principal executive offices, including zip code)

                                 510-623-9400
             (Registrant's telephone number, including area code)

                                     N/A
         (Former name or former address, if changed since last report)

Check the appropriate box below if the Form 8-K filing is intended to
simultaneously satisfy the filing obligation of the registrant under any of
the following provisions (see General Instruction A.2. below):

[ ] Written communications pursuant to Rule 425 under the Securities Act
    (17 CFR 230.425)

[ ] Soliciting material pursuant to Rule 14a-12 under the Exchange Act
    (17 CFR 240.14a-12)

[ ] Pre-commencement communications pursuant to Rule 14d-2(b) under the
    Exchange Act (17 CFR 240.14d-2(b))

[ ] Pre-commencement communications pursuant to Rule 13e-4(c) under the
    Exchange Act (17 CFR 240.13e-4(c))




Item 8.01.  Other Events.

            On July 9, 2007, Aehr Test Systems issued a press release
announcing the appointment of Joel Bustos as Vice President of Operations.  A
copy of the press release is attached hereto as Exhibit 99.1.



Item 9.01.  Financial Statement and Exhibits.

        (d)  Exhibits.

             Exhibit No.    Description
             -----------    -----------
             99.1           Press Release of Aehr Test Systems dated
                            July 9, 2007 entitled "Aehr Test Systems
                            Appoints Joel Bustos as Vice President of
                            Operations."




                                  SIGNATURES

            Pursuant to the requirements of the Securities Exchange Act of
1934, the Registrant has duly caused this report to be signed on its behalf
by the undersigned hereunto duly authorized.

                                               Aehr Test Systems
                                                  (Registrant)
Date:  July 10, 2007
                                          By:  /S/ GARY L. LARSON
                                               -------------------------
                                               Gary L. Larson
                                               Vice President of Finance and
                                               Chief Financial Officer



                               EXHIBIT INDEX

Exhibit
Number     Description
- -------    ------------

99.1       Press Release of Aehr Test Systems dated July 9, 2007 entitled
           "Aehr Test Systems Appoints Joel Bustos as Vice President of
           Operations."






- - more -

EX-99

                                                          Exhibit 99.1

[LOGO]AEHR TEST SYSTEMS

FOR IMMEDIATE RELEASE
- ---------------------

Contact:

Erin Cox
Financial Relations Board for Aehr Test Systems
Analyst/Investor Contact
(310) 854-8319


                  AEHR TEST SYSTEMS APPOINTS JOEL BUSTOS
                     AS VICE PRESIDENT OF OPERATIONS

Fremont, CA (July 9, 2007) - Aehr Test Systems (Nasdaq: AEHR), a leading
supplier of semiconductor test and burn-in equipment, today announced that
Joel Bustos has been appointed to the newly created position of Vice
President of Operations.  In this position, Mr. Bustos will be responsible
for overseeing Aehr Test's manufacturing, procurement, manufacturing
engineering and quality assurance functions.

Mr. Bustos has more than 20 years of management experience in the high tech
industry.  He joins Aehr Test from Celestica, where he was General Manager
of the Global Consumer Business Unit for the electronic manufacturing
services provider.  In his various positions with Celestica, he was
responsible for business development, project management, engineering,
human resources, finance, customer service repair and all manufacturing
operations.  Previously, Mr. Bustos was a General Manager at Flextronics
International, a leading global provider of electronic manufacturing
services.  At Flextronics, Mr. Bustos was responsible for a multi-site,
multi-shift operation, including oversight of business development,
finance, sales, project management, engineering, human resources and all
operational responsibilities.

"The addition of the Vice President of Operations to our management team
reflects the continuing development of the infrastructure necessary to
accommodate increasing customer demand in the future," said Rhea Posedel,
chairman and chief executive officer of Aehr Test Systems.  "Joel has an
exceptional background in high tech manufacturing and operations
management.  We anticipate that his expertise will be valuable in helping
us to scale our operations and efficiently manage our growth in the years
ahead."

About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a leading
worldwide provider of systems for burning-in and testing DRAMs, flash, and
other memory and logic integrated circuits and has an installed base of more
than 2,500 systems worldwide.  Aehr Test has developed and introduced several
innovative products, including the FOXTM, MTX and MAX systems and the DiePakR
carrier.  The FOX system is a full wafer contact test and burn-in system.
The MTX system is a massively parallel test system designed to reduce the
cost of memory testing by performing both test and burn-in on thousands of
devices simultaneously.  The MAX system can effectively burn-in and
functionally test complex devices, such as digital signal processors,
microprocessors, microcontrollers and systems-on-a-chip.  The DiePak
carrier is a reusable,

                                  -more-


Aehr Test Systems Appoints Joel Bustos as Vice President of Operations
July 9, 2007
Page 2


temporary package that enables IC manufacturers to perform cost-effective
final test and burn-in of bare die.  For more information, please visit the
Company's website at www.aehr.com.

Safe Harbor Statement
This release contains forward-looking statements that involve risks and
uncertainties relating to projections regarding customer demand and
acceptance of Aehr Test's products.  Actual results may vary from projected
results.  These risks and uncertainties include without limitation, economic
conditions in Asia and elsewhere, world events, conversion of quote activity
to purchase orders and acceptance by customers of Aehr Test's technologies,
acceptance by customers of the systems shipped upon receipt of a purchase
order and the ability of new products to meet customer needs or perform as
described, and the Company's development and manufacture of a commercially
successful wafer-level test and burn-in system.  See Aehr Test's recent 10-K
report, 10-Q report and other reports from time to time filed with the
Securities and Exchange Commission (SEC) for a more detailed description
of the risks facing our business.  The Company disclaims any obligation to
update information contained in any forward-looking statement to reflect
events or circumstances occurring after the date of this press release.



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